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Figure 4
(a) X-ray diffraction image capturing the self-fabricated high-quality flat crystal. (b) Profile of crystal EDS slope error within the red dashed frame along the meridional direction in (a). (c) Profiles of incident wavefront height error without a crystal sample, with a crystal sample and absolute crystal diffraction wavefront height error.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 5| September 2024| Pages 1146-1153
https://doi.org/10.1107/S1600577524006222
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