Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurements

Liu, F.; Li, M.; Diao, Q.; Li, Z.; Shen, Z.; Li, F.; Hong, Z.; Lian, H.; Yue, S.; Hou, Q.; Zhang, C.; Zhang, D.; Li, C.; Yang, F.; Yang, J.

doi:10.1107/S1600577524006222

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Figure 6
(a) Crystal EDS slope error profiles for three measurements and the average profile. (b) Point-by-point r.m.s. curve after subtracting the average slope error from three measurements. (c) Wavefront height error profiles for three measurements and the average profile. (d) Point-by-point r.m.s. curve after subtracting the average height error from three measurements.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 5| September 2024| Pages 1146-1153

https://doi.org/10.1107/S1600577524006222

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