Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurements

Liu, F.; Li, M.; Diao, Q.; Li, Z.; Shen, Z.; Li, F.; Hong, Z.; Lian, H.; Yue, S.; Hou, Q.; Zhang, C.; Zhang, D.; Li, C.; Yang, F.; Yang, J.

doi:10.1107/S1600577524006222

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Figure 8
(a) Mirror surface slope error measured using the DES method and LTP. (b) Mirror surface height error profiles. (c) Surface height error deviations between the two methods.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 5| September 2024|

https://doi.org/10.1107/S1600577524006222

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