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Figure 6
Photoelectron spectra of size-selected ENPs. Top row: Al 2p photoelectron spectra from size-selected (150, 100, 80 and 50 nm) ENP agglomerates. The blue dots are raw data and the black line is the peak fit. For small particle diameter, signal becomes low compared with background, which causes a visible slope in the background profile. Bottom row: corresponding SMPS scans for each size-selected system. The main peak corresponds to the size-selected particles and the second peak at higher particle diameter (i.e. electrical mobility diameter) corresponds to doubly charged particles. The peak features at lower particle diameters are measurement artefacts.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 5| September 2024| Pages 1382-1392
https://doi.org/10.1107/S1600577524005411
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