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Figure 3
Characterization of the X-ray detector system utilizing the X-ray test pattern (Xradia Inc., model X500-200-30) and 26 keV single harmonic illumination (t stands for scintillator thickness). Top left: M Plan Apo with LYSO:Ce (t = 250 µm). Top right: M Plan Apo with LuAG:Ce (t = 250 µm). Bottom left: NUV M Plan Apo with LYSO:Ce (t = 250 µm). Bottom right: NUV M Plan Apo with LuAG:Ce (t = 250 µm).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 5| September 2024| Pages 1224-1233
https://doi.org/10.1107/S1600577524007306
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