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Figure 4
MTF obtained via the slanted-edge approach utilizing the GaAs [110] wafer along the cleavage plane inclined for 5° along the vertical axis of the detector. The cleaved edge was imaged with single harmonic X-ray illumination at 18 keV utilizing two detector arrangements; namely, with the 10× NUV-sensitive and visible-light-sensitive M Plan Apo microscopes combined with both LYSO:Ce and LuAG:Ce scintillator single crystals of 250 µm thickness.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 5| September 2024| Pages 1224-1233
https://doi.org/10.1107/S1600577524007306
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