Hyperspectral full-field quick-EXAFS imaging at the ROCK beamline for monitoring micrometre-sized heterogeneity of functional materials under process conditions

Briois, V.; Itié, J.P.; Polian, A.; King, A.; Traore, A.S.; Marceau, E.; Ersen, O.; La Fontaine, C.; Barthe, L.; Beauvois, A.; Roudenko, O.; Belin, S.

doi:10.1107/S1600577524006581

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Figure 15
(a) Fe K-edge and (b) Cu K-edge pure spectra isolated by MCR-ALS during the FF hyperspectral XAS imaging monitoring of the activation of the FeCu/SiO₂ catalyst presented in Figs. 14

(b) and 14(d).

JOURNAL OF
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ISSN: 1600-5775

Volume 31| Part 5| September 2024| Pages 1084-1104

https://doi.org/10.1107/S1600577524006581

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