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![[Figure 2]](uc5005fig2mag.jpg)
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Figure 2
Spatial resolution evaluated from the Xradia resolution pattern and from the edge profile line of the sample. (a) Normalized (dark image and flat-field-corrected) projection of the Xradia resolution pattern (Zeiss) recorded at 7225 eV using a 5× magnifying Mitutoyo objective with a pixel size of 1.3 µm × 1.3 µm at 8 mm from the LuAG:Ce scintillator and (b) zoom (top) of the top horizontal bar boxed in blue in (a): the black lines are spaced from each other by a calibrated distance, ranging from 8 to 0.5 µm. The moment at which the black ticks cannot be distinguished from each other indicates the spatial resolution limit. A profile (bottom) of the intensity of the red line displayed in the zoom. The green dashed line indicates the pixel index at which the profile line no longer exhibits regular oscillation revealing the limit of spatial resolution. Edge profile line of the sample for (c, d) case study 1 and (e, f) case study 3. For both cases the image on the left represents the absorption map at 7159 eV corrected from the flat-field and the electronic noise of the camera. The procedure to estimate the spatial resolution consists of plotting a profile line somewhere in the absorption map where an abrupt change of the contrast was observed. This was done on the edge of the spin transition single crystal in (c) and on the wall of the quartz capillary containing the catalyst in (e) crossed by the green line on the absorption maps. The intensity along this line relative to the pixel number, converted into micrometres according to the size of the pixel reported in Table 1 ![[link]](../../../../../../logos/arrows/s_arr.gif){kind=small} , is then plotted in (d) and (f) (blue line with crosses) and the derivative of this curve is calculated (blue circle). The spatial resolution was estimated to be ∼2.5 µm and ∼6.9 µm by calculating the FWHM of the derivative fit by a Gaussian model (orange line) for case studies 1 and 3, respectively. |
![[Figure 2]](uc5005fig2.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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