BEATS: BEAmline for synchrotron X-ray microTomography at SESAME

Iori, G.; Alzu'bi, M.; Abbadi, A.; Al Momani, Y.; Hasoneh, A.R.; Van Vaerenbergh, P.; Cudin, I.; Marcos, J.; Ahmad, A.; Mohammad, A.; Matalgah, S.; Foudeh, I.; Al Najdawi, M.; Amro, A.; Ur Rehman, A.; Abugharbiyeh, M.; Khrais, R.; Aljadaa, A.; Nour, M.; Al Mohammad, H.; Al Omari, F.; Salama, M.; García Fusté, M.J.; Reyes-Herrera, J.; Morawe, C.; Attal, M.; Kasaei, S.; Chrysostomou, C.; Kołodziej, T.; Boruchowski, M.; Nowak, P.; Wiechecki, J.; Fatima, A.; Ghigo, A.; Wawrzyniak, A.I.; Lorentz, K.; Paolucci, G.; Lehner, F.; Krisch, M.; Stampanoni, M.; Rack, A.; Kaprolat, A.; Lausi, A.

doi:10.1107/S1600577524005277

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Figure 3
(a) Photograph of the BEATS DMM installed in the beamline's optics hutch. The two multilayer coatings and the cooling circuit of the first optical element are indicated. (b) Reflection angle for both DMM stripes at different working energies. The reflection angle was calculated using the refraction corrected Bragg equation following Morawe (2019

) and validated experimentally by scans of metal foils at the respective K-edge absorption energies. (c) Simulated monochromatic flux density at the sample position (42 m from source) obtained with the XOPPY (Sanchez del Rio & Dejus, 2004

) and ShadowOui (Rebuffi & Sánchez del Río, 2016

) tools contained in the OASYS suite (Rebuffi & Rio, 2017

). Optical surfaces and multilayer properties were modelled using the surface metrology results provided by the substrate's supplier and obtained at the ESRF Multilayer Laboratory (France), respectively.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 5| September 2024| Pages 1358-1372

https://doi.org/10.1107/S1600577524005277

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