BEATS: BEAmline for synchrotron X-ray microTomography at SESAME

Iori, G.; Alzu'bi, M.; Abbadi, A.; Al Momani, Y.; Hasoneh, A.R.; Van Vaerenbergh, P.; Cudin, I.; Marcos, J.; Ahmad, A.; Mohammad, A.; Matalgah, S.; Foudeh, I.; Al Najdawi, M.; Amro, A.; Ur Rehman, A.; Abugharbiyeh, M.; Khrais, R.; Aljadaa, A.; Nour, M.; Al Mohammad, H.; Al Omari, F.; Salama, M.; García Fusté, M.J.; Reyes-Herrera, J.; Morawe, C.; Attal, M.; Kasaei, S.; Chrysostomou, C.; Kołodziej, T.; Boruchowski, M.; Nowak, P.; Wiechecki, J.; Fatima, A.; Ghigo, A.; Wawrzyniak, A.I.; Lorentz, K.; Paolucci, G.; Lehner, F.; Krisch, M.; Stampanoni, M.; Rack, A.; Kaprolat, A.; Lausi, A.

doi:10.1107/S1600577524005277

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Figure 9
(a) Radiograph of the X-ray resolution target (XRCAL-2µm, Applied Nanotools Inc., Canada). (b) Detail (enlarged) of (a) showing series 0 and 1 of a micro-USAF test pattern. Element 6 of series 1 of the pattern (contoured in red) corresponds to line pairs of 0.357 lp µm⁻¹. (c) Intensity horizontal line profile through (b).

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ISSN: 1600-5775

Volume 31| Part 5| September 2024| Pages 1358-1372

https://doi.org/10.1107/S1600577524005277

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