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Figure 9
(a) Radiograph of the X-ray resolution target (XRCAL-2µm, Applied Nanotools Inc., Canada). (b) Detail (enlarged) of (a) showing series 0 and 1 of a micro-USAF test pattern. Element 6 of series 1 of the pattern (contoured in red) corresponds to line pairs of 0.357 lp µm−1. (c) Intensity horizontal line profile through (b). |
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