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Figure 7
(Top) Photograph of a 2000 mm-long sample holder with Si substrates mounted on top. (Bottom left) Measured XRR profile of the periodic 20-layer pair Cr/C ML fabricated in dynamic mode. (Bottom right) Periodic thickness (d) variation as a function of length over 2000 mm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
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