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Figure 1
Diffractograms of sample SK2 (λ = 0.154 nm), (a) from the reverse (DSCC Skeleton®) side and (b) from the front (polished Si) side.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 5| September 2024| Pages 1179-1188
https://doi.org/10.1107/S1600577524006088
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