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Figure 13
Cross-sections of maps of thermally induced deformation under exposure to hard X-ray radiation: (a) monocrystalline silicon (PVSi = 411.1 nm, std = 5.9 µrad), (b) DSCC Skeleton® (PVSk = 189.6 nm, std = 2.8 µrad) and (c) monocrystalline diamond (PVD = 12.2 nm, std = 0.17 µrad) (calculation in SolidWorks software). The abbreviation `std' (standard deviation) means the root-mean-square of slope deviation from the plane. |