Journal of Synchrotron Radiation
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Figure 3
PSD functions of the surface roughness of sample SK1 (AFM data).
σ
eff
= 0.8 nm,
σ
2×2
= 0.15 nm and
σ
40×40
= 0.7 nm.
JOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31
|
Part 5
|
September 2024
|
Pages 1179-1188
https://doi.org/10.1107/S1600577524006088
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access
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