A 1D imaging soft X-ray spectrometer for the small quantum systems instrument at the European XFEL

Agåker, M.; Söderström, J.; Baumann, T.M.; Englund, C.-J.; Kjellsson, L.; Boll, R.; De Fanis, A.; Dold, S.; Mazza, T.; Montaño, J.; Münnich, A.; Mullins, T.; Ovcharenko, Y.; Rennhack, N.; Schmidt, P.; Senfftleben, B.; Turcato, M.; Usenko, S.; Meyer, M.; Nordgren, J.; Rubensson, J.-E.

doi:10.1107/S1600577524005988

Journal of Synchrotron Radiation Journal of
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Figure 1
A top view showing the principle of the 1D imaging soft X-ray spectrometer. A Wolter mirror pair forms a magnified image of the sample along the XFEL beam on the detector in the horizontal plane, while the grating diffraction forms a wavelength-dispersed spectrum in the perpendicular plane. The detector image shows spectral features unique to the three particular positions indicated in the sample along the XFEL beam.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 5| September 2024|

https://doi.org/10.1107/S1600577524005988

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