Study on the UV FEL single-shot damage threshold of an Au thin film

Wu, M.; Li, Q.; Wang, M.; Zhu, Q.; Cai, J.; Xu, Z.; Zhou, H.; Huang, L.; Zhang, B.; Qi, R.; Zhang, Z.; Li, W.; Zhong, Y.; Zhang, W.

doi:10.1107/S1600577524005332

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Figure 11
Finite-element analysis of the temperature distribution of the Au film upon FEL exposure. (a) Surface with 5 µJ FEL pulse. (b) Surface with 50 µJ FEL pulse. (c) Depth 16 nm with 50 µJ FEL pulse. (d) Depth 20 nm with 50 µJ FEL pulse.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 5| September 2024| Pages 1010-1018

https://doi.org/10.1107/S1600577524005332

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