Study on the UV FEL single-shot damage threshold of an Au thin film

Wu, M.; Li, Q.; Wang, M.; Zhu, Q.; Cai, J.; Xu, Z.; Zhou, H.; Huang, L.; Zhang, B.; Qi, R.; Zhang, Z.; Li, W.; Zhong, Y.; Zhang, W.

doi:10.1107/S1600577524005332

Journal of Synchrotron Radiation Journal of
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Figure 7
Profilometer-measured surface damage of Au thin film with line profiles along the x and y axes for exposure times of 2 h 30 min (a) and 10 h (b) with 5 µJ FEL pulse energy.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 5| September 2024| Pages 1010-1018

https://doi.org/10.1107/S1600577524005332

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