view article
Figure 1
Sample geometry at the GALAXIES beamline (top view). The incident X-ray with horizontal linear polarization impinges on the sample at an angle θ. The emitted electrons are detected by the hemispherical electron analyser. The sample position can be adjusted along three directions denoted x, y, z, and the polar rotation θ. A pseudo axis (pseudo y) moves the sample along the surface.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 6| November 2024| Pages 1505-1513
https://doi.org/10.1107/S1600577524008865
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS