A study of structural effects on the focusing and imaging performance of hard X-rays with 20–30 nm zone plates

Tong, X.; Dhamgaye, V.; Chen, Q.; Wu, Q.; Deng, B.; Zhang, L.; Fox, O.; Wang, H.; Zhao, J.; Chen, Y.; Xu, Z.; Li, P.; Sawhney, K.

doi:10.1107/S1600577524009615

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Figure 4
Focusing and imaging quality of the Pt-HSQ-ZPs measured using TXM. TXM images of a Siemens star test sample using the Pt-HSQ-ZPs with resolutions of (a) 30 nm and (b) 20 nm. The energy was 7.2 keV and the dwell time was 10 s. (c) SEM image of the Siemens star with a minimum resolution of 20 nm. Focusing performance characterization using X-ray ptychographic CDI and 2D intensity distribution for (d) 30 nm and (e) 20 nm Pt-HSQ-ZPs.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 6| November 2024| Pages 1457-1463

https://doi.org/10.1107/S1600577524009615

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