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Figure 3
Simultaneously taken XRD and XRS data of a polycrystalline CeO2 sample in pellet form. (a) Stitched miniXRD detector image from the ambient temperature data shown in panel (b). (b) XRD data for CeO2 at ambient temperature (RT) and T = 700°C after azimuthal integration and the result of a Rietveld refinement at T = 700°C. (The small peaks around 2θ = 20°, 21° and 49° are due to diffraction from the sample holder used.) (c) Ce N4,5 excitation spectra measured using X-ray Raman scattering spectroscopy at a momentum transfer of q = 9.3 Å−1.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 6| November 2024| Pages 1622-1626
https://doi.org/10.1107/S1600577524009147
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