view article
Figure 1
(a) Thickness homogeneity measurements along the sagittal direction of the W/Si DMM stripe for pre-deposition substrates (light blue circles) and final DMM stripes (dark blue triangles) at the BAMline. The lateral thickness was determined by X-ray reflectometry thickness measurements, carried out for a DMM test report by AXO Dresden GmbH. The specified optical aperture and homogeneity are marked with the green rectangle. (b) A simple model following the inhomogeneity measurements to explain the origin of the stripe pattern on an unnormalized image. The irregularities on the DMM surface introduce phase shifts which are then transformed to vertical intensity modulations on the detector.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 6| November 2024| Pages 1551-1560
https://doi.org/10.1107/S1600577524008646
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS