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Figure 5
Overview of the MFX instrument layout. Distances are in meters from the nominal interaction region on the sample table; positive values indicate the beam's propagation direction. M is a mirror in the LCLS XRT for harmonic rejection and beam deflection to MFX. Lenses at 41.3 are pre-focusing CRLs. D, PP and Att at 40.2 is a diagnostic section with a Ce:YAG screen, single-pulse-picker and ten silicon attenuators. S and D are slits and diagnostics for beam-viewing and intensity measurement. A transfocator mounts the CRLs for a controllable spot size. A TT, now known as an arrival time monitor, measures the optical laser's arrival time relative to the X-rays. The double slits at 1.2 block beam harmonics. L-IN is the laser in-coupling for the optical laser. D at 3.0 is a Ce:YAG screen diagnostic to view the post-detector beam. The MFX sample (0.0 on this figure) is about 420 m downstream of the X-ray source within the undulator. Reproduced with permission from Sierra et al. (2019BB124).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 3| May 2025|
https://doi.org/10.1107/S1600577525002735
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