High-resolution X-ray scanning with a diffuse Huffman-patterned probe to reduce radiation damage

Aminzadeh, A.; Kingston, A.M.; Roberts, L.; Paganin, D.M.; Petersen, T.C.; Svalbe, I.D.

doi:10.1107/S1600577525002127

Journal of Synchrotron Radiation Journal of
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Figure 12
Pinhole images of the 32 × 32 quaternary mask. (a) Mean X-ray bucket image obtained for the P mask. (b) Mean bucket image for the N mask. (c) Original Huffman-like array, black = −3, white = +3. (d) Reconstructed X-ray pinhole image of the 32 × 32 Huffman-like mask.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 3| May 2025|

https://doi.org/10.1107/S1600577525002127

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