High-resolution X-ray scanning with a diffuse Huffman-patterned probe to reduce radiation damage

Aminzadeh, A.; Kingston, A.M.; Roberts, L.; Paganin, D.M.; Petersen, T.C.; Svalbe, I.D.

doi:10.1107/S1600577525002127

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 9
Optical images of some of the fabricated test objects: (a) 5 µm and 10 µm pinholes, (b) a binary object (bee image) and (c) disk with four quadrants, each quadrant having a different uniform thickness (L3 < L2 < L1 < L0).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 3| May 2025|

https://doi.org/10.1107/S1600577525002127

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