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Figure 5
Conceptualized application of 3DMPR to a multi-material object composed of materials I, II and III, as shown in (a). Images shown represent single slices of the CT volume with the assumption of contrast isolation between all materials as in the histogram (b). Dashed, vertical lines demonstrate example threshold bounds for creating material masks, shown in (c), (d) and (e). The inverse of these masks, black regions, can be used to mask away all other material components, allowing phase retrieval to be performed to internal material regions using equation (1)[link]. The boundary regions are interleaved from appropriately tuned retrievals, located using binary operations between the material masks after an additional dilation (f), (g), (h). Panel (i) shows the result of a binary `and' operation between the material I and II masks, creating a trace of the I/II interface for interleaving. Panel (j) demonstrates the same for the II/III interface, overcoming the convention limit of two-way material boundaries.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 5| September 2025| Pages 1319-1327
https://doi.org/10.1107/S1600577525005843
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