Multimodal hard X-ray nanoprobe techniques for operando investigations of photovoltaic devices

Choi, E.; Wieghold, S.; Perini, C.A.R.; Luo, Y.; Kim, S.; Correa-Baena, J.-P.; Stranks, S.D.; Parker, J.E.

doi:10.1107/S1600577525006034

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Figure 4
XRF intensity maps of Pb (a)–(e) and corresponding XBIC maps (f)–(j) depending on the concentrations of MACl additive: (a) and (f) without MACl (0% MACl, the control sample), (b) and (g) with 1% MACl, (c) and (h) 3% MACl, (d) and (i) 5% MACl, (e) and (j) 7% MACl.

JOURNAL OF
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ISSN: 1600-5775

Volume 32| Part 5| September 2025| Pages 1211-1219

https://doi.org/10.1107/S1600577525006034

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