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Figure 3
Optical image of the (a) ep­oxy coated flat end of sample mounting pin viewed end on. (b) 50 µm glass sphere sample plus manipular needle in the FOV but out of focus as above the mounting pin. (c) Align sample above pin. (d) Lower sample onto pin. (e) Sample sticks to pin and needle raised. (f) Needle retracted leaving sample on pin.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 5| September 2025| Pages 1282-1290
https://doi.org/10.1107/S1600577525005053
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