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Figure 4
Statistical analysis of errors for the thickness profile measured by the proposed DLD-STXI method. (a) Probability density distribution of errors and (b) spatial distribution of the average and the variance of the absolute errors.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 5| September 2025| Pages 1310-1318
https://doi.org/10.1107/S1600577525005521
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