view article
Figure 1
(a) Schematic of the low-background sample chamber (not to scale). The sample is mounted on an FSC chip inside the chamber. A mask made of tungsten alloy is placed before the chip and acts as a pinhole. The chamber features a large exit window of Kapton foil allowing measurements up to high Q. (b) Section view of the chamber showing various components along the X-ray beam path.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 5| September 2025| Pages 1228-1234
https://doi.org/10.1107/S1600577525005594
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS