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Figure 3
Demonstration of in situ X-ray diffraction during an FSC scan. (a) Intensity profile I(Q) normalized by its maximum value, focusing on the vicinity of the first sharp diffraction peak to show its temperature dependence during the heating and cooling ramps of a scan. From dark blue to dark red, the curves show increasing temperatures, as indicated by the color bar. (b) Blue and yellow dots show the center position of the first sharp diffraction peaks, Qm1, as a function of time during two different scans. The temperature program is shown as the red line (right y axis).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 5| September 2025| Pages 1228-1234
https://doi.org/10.1107/S1600577525005594
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