view article
Figure 4
Image on the detector in the micro-CT regime without TXM optics (a), and in the nano-CT regime with TXM optics (b); a flat-field corrected image of the Siemens star test pattern in the TXM regime (c).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 6| November 2025| Pages 1452-1462
https://doi.org/10.1107/S1600577525007234
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS