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Figure 4
(a) Three diffraction patterns at 20 µm step in the lateral position of the imaging system relative to the X-ray beam. The white line is the projection along the vertical axis. (b) The diffraction pattern projection aligned at the lateral scan's central peak from −40 µm to 40 µm with 20 µm step.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 6| November 2025| Pages 1479-1490
https://doi.org/10.1107/S160057752500774X
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