High magnification optical imaging systems for the characterization of soft X-ray focii

Al Haddad, A.; Sarracini, A.; Schnorr, K.; Knopp, G.; Krempasky, J.; Arrell, C.; Augustin, S.; Bassement, L.; Brupbacher, K.; Vila-Comamala, J.; David, C.; Flechsig, U.; Follath, R.; Guo, Z.; Herzog, M.; Knurr, J.; Lombosi, C.; Manetti, E.; Mandal, S.; Morillo-Candas, A.S.; Qi, P.; Sorokin, B.V.; Stubbs, S.; Sun, Z.; Tiefenbacher, S.C.; Vonka, J.; Wagner, U.H.; Xie, X.; Yang, N.; Zhang, H.; Bostedt, C.

doi:10.1107/S160057752500774X

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Figure 5
Panels (a) and (c) show diffraction patterns from 1 keV and 0.6 keV, respectively. The horizontal diffraction orders were used to calculate the system's response, labeled in white in the image. Panels (b) and (d) show the image intensity versus local pulse energy density in the image. Positive and negative orders are labeled using a * and + markers, respectively.

JOURNAL OF
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RADIATION

ISSN: 1600-5775

Volume 32| Part 6| November 2025| Pages 1479-1490

https://doi.org/10.1107/S160057752500774X

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