High magnification optical imaging systems for the characterization of soft X-ray focii

Al Haddad, A.; Sarracini, A.; Schnorr, K.; Knopp, G.; Krempasky, J.; Arrell, C.; Augustin, S.; Bassement, L.; Brupbacher, K.; Vila-Comamala, J.; David, C.; Flechsig, U.; Follath, R.; Guo, Z.; Herzog, M.; Knurr, J.; Lombosi, C.; Manetti, E.; Mandal, S.; Morillo-Candas, A.S.; Qi, P.; Sorokin, B.V.; Stubbs, S.; Sun, Z.; Tiefenbacher, S.C.; Vonka, J.; Wagner, U.H.; Xie, X.; Yang, N.; Zhang, H.; Bostedt, C.

doi:10.1107/S160057752500774X

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Figure 6
Intensity dependence of various diffraction orders to the photon energy around the O 1s absorption edge. Central peak and ±1 orders show dependence on the absorption edge, contrary to the other orders. Error bars represent standard error.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 6| November 2025| Pages 1479-1490

https://doi.org/10.1107/S160057752500774X

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