BL46XU: an applied hard X-ray photoelectron spectroscopy beamline HAXPES II at SPring-8

Yasuno, S.; Takagi, Y.; Yasui, A.; Seo, O.; Osaka, T.; Sugahara, M.; Senba, Y.; Yamazaki, H.; Koyama, T.; Shimizu, S.; Saito, T.; Ohashi, H.; Kawamura, N.; Nakajima, K.; Motomura, K.; Nishihara, T.; Sato, M.; Tamenori, Y.; Yabashi, M.

doi:10.1107/S1600577525007660

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Figure 2
Photograph of HAXPES systems installed in (a) EH1 and (b) EH2. Focusing mirrors with different speciﬁcations are installed in EH1 and EH2, respectively.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 6| November 2025| Pages 1578-1585

https://doi.org/10.1107/S1600577525007660

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