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Figure 4
(a) Schematic and (b) photograph of the high-throughput HAXPES system comprising the (1) analysis chamber, (2) lower load lock and (3) six-axis manipulator. (c) Enlarged photograph of load-lock chamber. (d) Sample holder stocker.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 6| November 2025| Pages 1578-1585
https://doi.org/10.1107/S1600577525007660
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