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Figure 8
HAXPES measurements under atmospheric conditions. (a) Survey scan of Au thin film, (b) Au 4f peak of Au thin film, (c) survey scan of Si substrate and (d) Si 1s peak of Si substrate. For survey scans, the dwell time per point is 0.1 s. The total measurement times are 5 min for Au and 10 min for Si, attributed to variations in the measurement range. For narrow scans, the dwell time per point is 1 s for Au and 0.2 s for Si, resulting in total measurement times of 10 min for Au and 2 min for Si.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 6| November 2025| Pages 1578-1585
https://doi.org/10.1107/S1600577525007660
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