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Figure 6
(a) Reflectivity of several common coating materials as a function of incidence angle at a photon energy of 40 eV. (b) Variation in reflectivity with incidence angle for Si, Au and Al coatings under different polarization states. (c) Reflectivity of the M1 mirror coated with Au. (d) Reflectivity of the plane mirror M2 in the monochromator. (e) Reflectivity of the M3 mirror with a bare Si substrate. (f) Transmittance curves of several typical filters as a function of photon energy, with the selected filter materials and their corresponding energy ranges indicated for this beamline.

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SYNCHROTRON
RADIATION
ISSN: 1600-5775
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