Tender X-ray diffraction anomalous fine structure spectroscopy applied to the study of PbSc0.5Nb0.5O3 relaxor ferroelectric oxide

Ciatto, G.; Bing, Y.; Ye, Z.-G.; Janolin, P.-E.

doi:10.1107/S1600577525007428

Journal of Synchrotron Radiation Journal of
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Figure 3
Experimental and simulated Nb L₃-edge DAFS spectra for the same configurations at the (002) structural reflection. The vertical lines are guides to the eye, indicating the main feature positions.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 6| November 2025| Pages 1414-1420

https://doi.org/10.1107/S1600577525007428

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