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Figure 4
Process of crack localization using XRF and microscopy: (a) schematic of the XRF process, (b) XRF image, (c) optical microscope image, (d) registered XRF and microscopy images, (e) crack segmentation.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 6| November 2025| Pages 1503-1510
https://doi.org/10.1107/S1600577525008100
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