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Figure 2
Diffraction data collected in the cXDI-TM experiment. (a) A representative diffraction pattern of the toner particle at +30°. (b) Distribution of diffraction intensity in reciprocal space up to a resolution of 7.1 µm−1. (c) Comparison of diffraction patterns in a pair of symmetry-related sections at ±4.03 µm−1. (d) Resolution-dependent variations in Csym and Rmerge plotted against the square of the scattering vector length to equalize the volumes of the resolution shells. (e) X-ray diffraction profile up to a resolution of 10 µm−1 calculated by summing the radial average of each diffraction pattern. Panel (b) was prepared using ChimeraX (Pettersen et al., 2021View full citation).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 6| November 2025| Pages 1491-1502
https://doi.org/10.1107/S1600577525008008
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