Comparing image quality of synchrotron and laboratory nano-CT scans: a round robin study

Wittl, S.; Zabler, S.; Fell, J.; Villanova, J.; Lhuissier, P.; Hildebrandt, S.; Herrmann, H.-G.

doi:10.1107/S160057752600086X

Journal of Synchrotron Radiation Journal of
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Figure 7
(a) SiO₂-sphere-samples after debindering broken into fragments. (b) Fragment glued on pin tip with conductive carbon. (c) SEM-image of fragment sputter-coated with 30 nm carbon. (d) FIB-preparation showing ion beam removal. (e) Prepared ROI in shape of a cylinder with 30 µm in diameter.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 2| March 2026| Pages 489-507

https://doi.org/10.1107/S160057752600086X

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