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Figure 6
Si 2p XPS spectra of the SiO2/Si interface at varying photon energies from 500 eV to 5000 eV.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 2| March 2026| Pages 523-530
https://doi.org/10.1107/S1600577525011506
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