Defocused illumination with beam-shaping condenser for uniform wide-field X-ray imaging

Zhang, K.; Luo, Y.; Di, Y.; Guo, C.; Li, C.; He, M.; Zhang, C.; Peng, F.; Liu, W.; Wu, Z.; Guan, Y.; Tian, Y.; Liu, G.

doi:10.1107/S1600577525011373

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Figure 10
Normalized central line intensity profiles of the focal spots at 750 eV recorded on the detector with defocus distances of 0, 1, 3 and 5 mm for two secondary light source sizes: (a) 400 µm × 20 µm and (b) 400 µm × 80 µm.

JOURNAL OF
SYNCHROTRON
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ISSN: 1600-5775

Volume 33| Part 2| March 2026| Pages 429-436

https://doi.org/10.1107/S1600577525011373

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