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Figure 4
Phase reconstruction of a beryllium CRL (R = 200 µm) at 14 keV with 5 µm coded mask using ESPINNet and XSVT. (a, b) Predicted horizontal and vertical refraction using ESPINNet. Panels (c) and (d) show relative phase errors of ESPINNet and XSVT with N = 20 compared with the ground truth (XSVT with N = 100), respectively. (e) Predicted phase using ESPINNet. (f) Vertical line profile of the phase (red dashed line: phase profile of the ground truth; black dashed line: phase profile retrieved using ESPINNet; black solid line: relative phase error of ESPINNet compared with ground truth; blue solid line: relative phase error of XSVT with N = 20 compared with ground truth). The 5 µm coded mask was scanned with a step size of 3 µm and an `XY' 2D pattern. Data were acquired at the 1BM beamline of APS.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 2| March 2026| Pages 467-480
https://doi.org/10.1107/S1600577526000846
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