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Figure 4
(a) X-ray fluorescence line-scan of the demonstration sample. Calculated XRF characteristic lines positions are indicated with the vertical lines in the bottom panel. (b) Total intensity (global), Compton, La, Ce, W and Cu XRF-CT sinograms. (c) XRF-CT y-cross section. La, Ce, and W reconstructions are overlayed on a Compton map. (d) Individual XRF spectra corresponding to La, Ce and W lines from the ROI pixels chosen from the y-cross section.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 2| March 2026| Pages 531-542
https://doi.org/10.1107/S1600577526001104
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