view article
Figure 5
(a) X-ray diffraction line-scan of the demonstration sample. The top panel values are obtained by averaging along the scattering vector, q, axis. Simulated XRD profiles are shown by vertical lines in the bottom panel. (b) Global, quartz, Al2O3, W, Pt, Cu, Ni, and CeO2 sinograms. (c) Reconstructed XRD-CT y-cross section. Individual reconstructions are overlayed. (d) XRD spectra corresponding to individual phases from the pixels chosen on the y-cross section.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 2| March 2026| Pages 531-542
https://doi.org/10.1107/S1600577526001104
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS