High-throughput X-ray total scattering measurement system at BL04B2 of SPring-8

Yamada, H.; Shimono, S.; Kawaguchi, S.; Ohara, K.; Watanabe, K.; Takemoto, M.; Tseng, J.-; Takahashi, M.; Sada, Y.; Yamazaki, H.; Ohashi, H.; Imai, Y.; Hatsui, T.; Inoue, I.; Kimura, S.; Sugimoto, K.; Yabashi, M.; Sakata, O.; Higo, Y.; Tamasaku, K.

doi:10.1107/S1600577525011294

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Figure 5
(a) XRD pattern and Rietveld refinement of CeO₂. (b) Full width at half-maximum of Bragg peaks obtained via the Rietveld refinement of CeO₂.

JOURNAL OF
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RADIATION

ISSN: 1600-5775

Volume 33| Part 2| March 2026| Pages 516-522

https://doi.org/10.1107/S1600577525011294

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