X-ray fluorescence microscopy exposure estimates using a single excitation energy

Roter, B.; Crawford, A.M.; O'Halloran, T.V.; Jacobsen, C.

doi:10.1107/S1600577526004923

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Figure 2
The distribution of total X-ray fluorescence photons detected in each pixel around different elemental LODs $[\rho_{\min}^{\prime}]$ in our experiment at beamline 8-BM-B (Roter et al., 2026

). Shown here are histograms of probability densities for several elements with respect to the total number N_fluor of XRF photons detected for sample pixels within 1% of each element's LOD, which we obtained by summing up the contributions from all detector elements. From those distributions, we were able to calculate the mean minimum number of X-ray fluorescence photons $[\bar{N\,}\!_{{\rm fluor}}]$ detected per pixel.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 4| July 2026|

https://doi.org/10.1107/S1600577526004923

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