X-ray fluorescence microscopy exposure estimates using a single excitation energy

Roter, B.; Crawford, A.M.; O'Halloran, T.V.; Jacobsen, C.

doi:10.1107/S1600577526004923

Journal of Synchrotron Radiation Journal of
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Figure 3
Subshell-specific calculations of the minimum number of incident photons $[\bar{N\,}\!_{{\rm inc}}]$ per pixel for a fixed incident photon energy of E_inc = 10 keV, with and without the `jump ratio' approximation. The (E-D PCS + CK) calculations were carried out using excitation-dependent mass photoionization partial cross sections, while the less-accurate (JR + CK) calculations were carried out using the `jump ratio' approximation of equation (4)

. In both cases, Coster–Kronig transitions were included (CK). As can be seen, the `jump ratio' approximation leads to inaccurately high calculated values of $[\bar{N\,}\!_{{\rm inc}}]$ , in particular when considering fluorescence from L₁ lines when the excitation energy E_inc is well above the edge energy E_L₁. We assumed a windowless EDS detector and a vacuum environment for these calculations so as to not affect $[\bar{N\,}\!_{{\rm inc}}]$ at lower L fluorescence emission energies. Tabulated data from xraylib (Schoonjans et al., 2011

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 4| July 2026|

https://doi.org/10.1107/S1600577526004923

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